MATERIAL CHARACTERIZATION
Material Science and Metallography
- Transmission Electron Microscope TEM Application :
- Surface and interface Topography and Morphology.
- SAED compositional and crystalline information.
- Crystal defect and nanometer scale and elemental maps characterization.
- Material Science studies of dislocations, grain boundaries, voids, stacking faults.
- Sample Preparation : Reactive Ion Milling and Sample holder grids.
- Scanning Electron Microscope SEM Application :
- Failure Analysis and Reverse engineering.
- Grain Size, Sample cross section, Surface morphology and Defect studies.
- Elemental microanalysis and particle with EDAX characterization.
- Resolution : 1 nM @15 Kv
- Attachment : EDS Detector for Material Compositional Analysis EDAX.
- Nuclear Magnetic Resonance NMR Ideal Application :
- Chemical structure, composition identification and analysis.
- Identification of sample purity and raw materials fingerprinting.
- Determination of end group in polymer, Reaction kinetics and mechanism examination.
- Quantitative compositional information on mixtures.
- Signal : Radio frequency.
- Working Temperature : -80°C to 150°C.
- X-ray Photon Spectroscopy XPS Application :
- Surface analysis of organic and inorganic materials, stains or residues.
- Chemical Mapping and Identification of all elements except for H and He on surface and Thin films.
- Determining composition and chemical state information from surfaces. Surface and interface Topography and Morphology.
- Secondary Ion Mass Spectroscopy SIMS Application :
- Surface microanalysis of organic and inorganic materials.
- Ion imaging of thin film surfaces and interfaces.
- Depth profiling survey.
- Specific molecular information on thin (sub-monolayer) organic films/contaminants.
- Auger Electron Spectroscopy AES Ideal Application :
- Defect and particle analysis
- Surface chemical analysis
- Small-area depth profiling
- Thin film analysis and material composition.
- Metallurgical analysis.
- X-Ray Diffraction and Fluorescence XRD XRF Ideal Application :
- Determining quantitative phase composition, Lattice parameters, Alloy composition.
- Identification and quantification of crystalline phase, Doping concentration, Grain residual strain.
- Investigation of Crystal structure, Texture orientation, Rocking curve and X-ray reflectivity measurements.
Nano Analytical Chemistry
- Fourrier and IR Spectroscopy FTIR Ideal Application :
- Nano characterization and identification of complex mixtures of materials, gases, thick films, liquids and solid polymer and polymer blends.
- Surface analysis for analysis of adhesives, coatings and polymer adhesions.
- Particle Chemical analysis, stains and surface blemishes.
- Ultra Violet Spectroscopy UV-VIS Ideal Application :
- Absorption, transmission studies and investigation for solid and thin films.
- Optical Investigation properties of liquids and solids between 200 nm and 3300 nm.
- Quantification and quality assurance in determination of analytes in liquid solutions.
- Raman Photoluminescence Spectroscopy Ideal Application :
- Chemical fingerprinting on polymer and glass.
- Crystallographic orientation and Chemical bonds.
- Vibrational frequencies analysis of SiO, Si2O2 and Si3O3. Spatial and spectral resolution mapping.
- Zeta Pals and Zeta Potential Ideal Application :
- Determination of stability in colloidal dispersions.
- Quantitative analysis of Electrophoretic mobility and dynamic mobility.
- Chemical fingerprinting on polymer and glass.
- Detector Type : NIR GaAS Detector.
- Ultra Violet Spectroscopy UV-VIS Ideal Application :
- Absorption, transmission studies and investigation for solid and thin films.
- Optical Investigation properties of liquids and solids between 200 nm and 3300 nm.
- Quantification and quality assurance in determination of analytes in liquid solutions.
- Wavelength Range : 200 to 3200 nm.
Nano Applied Physics Measurements
- Atomic Force Microscope AFM Ideal Application
- Surface Morphology, Surface Roughness RMS, Step Height.
- Surface Potential, Work function, Young's modulus, Electric and Magnetic surface domain mapping.
- Mode Type : Contact, Non-Contact, MFM, SCM and KPFM.
- Temperature Stage : -20 C to 250 C.
- Hall Mobility, Carrier Density and Superconductors Ideal Application :
- Hall Voltage,Carrier Concentration, Coefficient and Carrier mobility.
- 4 probe room and low temperature sheet resistance, Vacuum, Pulse IV, CV measurement.
- Low Temperature Liquid N2 Measurements.
- He Superconducting pulse measurement and analysis.
- Probe Bench : 5 Probes DC Supply.
- Probe Size :10 um to 3 um.
- Liquid N2 : 77 Kelvin to 400 Kelvin.
- Liquid He : 5 Kelvin to 500 Kelvin.
- Magnet : +/- 2.5 Tesla.
- Laser Doppler Vibrometer LDV Ideal Application
- Static and Dynamic MEMS Measurements, Frequency domain resonance analysis.
- Time domain and Damping studies on 3D MEMS structures.
- Frequency Operation Range : 20MHz
- Resolution : 2 nM inplane.
- Ellipsometry and Spectroscopic Measurements Ideal Application :
- Spectroscopic Ellipsometry for thickness and optical properties ( n, K values) for single to multilayer thin films. Thickness 3D mapping and needed application.
- In line digital optical and dark field microscopes.
Data integrity and Time commitment
We believe in results and substance first, over flash. Our integrity value means we are consistently open, honest, ethical and genuine. We understand how crucial it is for our clients to quickly and efficiently fabricate and evaluate their conceptual prototype design, so they can move to the next iteration. In most of the cases our turnaround is often faster than your procurement cycle.
