We offer Nano Science & Research solutions for universities, research institutes, startups and companies participating in Nanotechnology. We also offer publication analysis package solutions for PhD scholars and researchers. We do reverse engineering and accommodate any known literature methods and/or your own existing fabrication steps including process parameters, device structure and size, temperature limitation.
Semiconductor device parameter analysis Id-Vd, Id-Vg, Transconductage, Threshold and Mobility measurements & more..
CV-Impedance, Dissipation of active and passive components, MIM, Mobile ion and Breakdown studies & more..
Smith chart, Time-Domain-Gating, Pulsed RF, Return Loss, Impedance Insertion loss measurements & more..
125 X 156 X and Non standard substrates. Isc, Jsc, Short circuit, Sun Voc and ICE efficiency & more..
Hall voltage, Mobility, Carrier concentration and hall coefficient measurements & more..
B-H curves, He-superconducting pulse and low temperature measurements & more..
Dynamic, static, frequency time domain, and damping measurements of MEMS hetero structures & more..
MFM, KPM, SCM, STM modes. Surface roughness and 3D surface morphological studies & more..
Price may change depending on the tool availability. Shipping cost and state tax may apply.
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