SEmiconductor electrical measurements
Curve Tracer and Device Parameter Probe Bench
- CV Impedance Test and Analyser. Ideal Uses :
- CV Impedance Dissipation factor on passive components.
- Mobile ion studies, SiOx and SiNx layer integrity.
- Determine breakdown voltages and IV's.
- Resistance,Capacitance, Carrier Recombination, Metal Insulator Metal profiles.
- DC and Device Probe Station Ideal Uses :
- Probe stations includes microscope/video system, vibration isolation table, probe card holders, RF and SMU DC probes needles calibration software and standards.
- Measurements of IV, Id-Vd, Id-Vg, Break down, Carrier Recombination, Reliability life time, Pulsed Id-Vd.
- Determining Mobility and Threshold Voltage in CMOS, RF MMIC and Memory devices.
- Test and pad structure design to extract Threshold Voltages, Body effect, Transconductance, Channel doping simulation.
Semiconductor Test Bench and RF Probe Station
- RF, MMIC, RF Antenna Measurements Ideal Uses :
- RF probe station for the research of advanced active and passive components. Stage comes with zoom microscope with 20X and 50 X magnification, LED ring Illuminator, precision x-y stage with RF probe tips.
- Determine Time -Domain -Gating mode, Pulsed RF, Return Loss, Impedance, Insertion Loss.
- Measurement and failure analysis Transmission Coefficient.
- Frequency conversion, S-Parameter, Antenna, Smith chart and signal integrity measurements.
- Frequency Range : 9 kHz to 70 GHz
- Impedance : 50 ohm or 75 ohm.
- Loss Parameter : 94 dB with 0.006 dB trace noise.
Solar-PV Lifetime Efficiency and SQUID
- PV Lifetime, Efficiency Tester Ideal Application :
- Determine Isc, Jsc, Short Circuit Current Isc, Sun Voc, Open Circuit Voltage Voc slope, Shunt resistance Rs.
- Measurement and result analysis of Maximum Power Pmax ( Vmax and Imax), FF, Fill Factor conversion efficiency, IQE, EQE, n-efficiency conversion and spectral response.
- Sample Size : 100m to 156 mm Si and pseudo squares.
- Hall Mobility, MPMS, SQUID Ideal Application :
- Hall Voltage,Carrier Concentration, Coefficient and Carrier mobility.
- 4 probe room and low temperature sheet resistance, Vacuum, Pulse IV, CV measurement.
- Low Temperature Liquid N2 and He Superconducting pulse measurement and analysis.
- Probe Size :10 um to 3 um. 5 Probes DC Supply.
- Liquid N2 : 77 Kelvin to 400 Kelvin.
- Liquid He : 5 Kelvin to 500 Kelvin.
Our Edge & Customers
We offer Nano Science & Research solutions for universities, research institutes, startups and companies participating in Nanotechnology. We also offer publication analysis package solutions for PhD scholars and researchers. We do reverse engineering and accommodate any known literature methods and/or your own existing fabrication steps including process parameters, device structure and size, temperature limitation.